By Dipl. Ing. Bernd Schwarz (auth.), Dr. G. Q. Zhang, Dr. L. J. Ernst, Mr. O. de Saint Leger (eds.)
Benefiting from Thermal and Mechanical Simulation in Micro-Electronics offers papers from the 1st overseas convention in this subject, EuroSimE2000. For the 1st time, humans from the electronics undefined, study institutes, software program businesses and universities joined jointly to debate current and attainable destiny thermal and mechanical similar difficulties and demanding situations in micro-electronics; the cutting-edge methodologies for thermal & mechanical simulation and optimization of micro-electronics; and the views of destiny simulation and optimization method development.
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In contrast to the first tester, a LVDT is used for displacement measurements. The second tester reaches consequently poorer resolutions of 10 mN and 1OOnm, which is sufficient to carry out equivalent experiments on the first and the second tester. 4. EXPERIMENTAL PRO GRAMM The material behavior of metals is usually investigated by two tests. Both tests are carried out at a defined temperature and load the material with either a constant strain rate or a constant stress. These two types of experiments led to a division in the consideration of material responses into linear elasticity, nonlinear plasticity (time independent) and creep (time dependent behavior).
It should be noted that we could straightforwardly establish these functions by an experiment, only in case that the strains and initial strains are not continuously changing. :: .................................. ....... t --+Fig. 3: Stress responses: Effect of increasing stress level Further it might be so, that the initial stress increment as well as the subsequent relaxation depends on "the stress level" present before application of the strain increment. In that case the relaxation modulus functions should be considered as stress-level dependent.
Thus K=K[[a(~, . and G=G[[a(~,. e-(t-~)Ir" (11) ,,=1 (12) ,,=1 The participation factors G n = Gn[a(~)] and K" = K"[a(q)] (the stiffness functions) are then subject to parameter investigation, when a number of appropriately spaced relaxation times is chosen. __---_. AlAVi --vVfVV£:----__4#Nt_--- ---- lim / At AAU lvmv --- . t Fig. l (mm) ~ m! AftUu AUft' 'vYv t ----- AAiAVi 'VV~ _. 1 i t """tv t Fig. 6c: Intermittent longitudinal DMA Specimen: ,25xl (mm) 45 In the torsional DMA-testing the longitudinal deformation remains completely free, while at certain (curing) times a sinusoidal torsional deformation, with amplitude Eo and angular frequency ro is applied.